Yoshino H.(hisashi.yoshino@toshiba.co.jp), Yamazaki M., Thanh T.D.
Selvamanickam V.(selva@igc.com), Lee H.G., Li Y., Xiong X., Qiao Y., Reeves J., Xie Y., Knoll A., Lenseth K.
Christen D.K., Kim K., Kwon Y.W., Norton D.P.(dnort@mse.u..edu), Budai J.D., Sales B.C., Chisholm M.F., Cantoni C., Marken K.
Cantoro M., Coppede N., Camposeo A., Labardi M., Pardi L., Fuso F., Allegrini M., Arimondo E., Baldini A., Botarelli A., Lancia M., Masciarelli G.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-Fe, PLD process, microstructure, experimental results, fabrication, magnetic properties
Muroga T., Izumi T., Shiohara Y., Yamada Y.(yyamada@istec.or.jp), Iwai H.
Osamura K., Matsumoto K.(matsu@hightc.mtl.kyoto-u.ac.jp), Takechi A., Ono T., Hirabayashi I.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, buffer layers, PLD process, microstructure, experimental results, fabrication, magnetic properties
Izumi T., Shiohara Y., Watanabe T.(t-nabe&istec.or.jp)
Ключевые слова: HTS, YBCO, REBCO, coated conductors, substrates, buffer layers, fabrication, IBAD process, PLD process, critical current density, review, critical caracteristics
Usoskin A., Oomen M.P., Freyhardt H.C.(hfreyha@gwdg.de), Issaev A.(issaev@umpsun1.gwdg.de), Dzick J.(jurgen.dzick@schott.com), Knoke J.(knoke@umpsun1.gwdg.de), Leghissa M.(martino.leghissa@erls.siemens.com), Neumueller H.-W.(Heinz-Werner-Neumueller@erls.siemens.de)
Ключевые слова: HTS, YBCO, coated conductors, substrate stainless steel, IBAD process, PLD process, fabrication, critical current, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, PLD process, current-voltage characteristics, n-value, fabrication, critical caracteristics, length
Arendt P.N., Foltyn S.R., DePaula R.F., Stan L., Groves J.R., Holesinger T.G., Aytug T., Christen D.K., Paranthaman M.P., Kang S., Feenstra R., Budai J.D.
Watanabe T., Maeda T., Mimura M., Ohashi Y., Hirabayashi I.(hirazum@istec.or.jp)
Kreiskott S., Gibbons B.J., Bronisz L., Peterson D., Matias V.(vlado@lanl.gov), Findikoglu A.T.
Ключевые слова: HTS, coated conductors, IBAD process, PLD process, reel-to-reel process, fabrication, review
Li Y., Qiao Y., Reeves J., Lenseth K., Selvamanickam V., Lee H.-., Xie Y.Y., Carota G., Funk M., Zdun K., Xie J., Likes K., Jones M., Hope L., Hazelton D.W.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni, IBAD process, PLD process, MOCVD process, fabrication
Osamura K., Ono T., Hirabayashi I., Matsumoto K., Takechi A.(takechi@kumax.kyoto-u.ac.jp)
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, SOE process, cap layers, PLD process, microstructure, critical current density, fabrication, critical caracteristics
Osamura K., Matsumoto K., Takechi A.(takechi@sd6.so-net.ne.jp)
Ключевые слова: HTS, YBCO, coated conductors, MOD process, buffer layers, substrate SrTiO3, PLD process, critical current density, fabrication, critical caracteristics
Ключевые слова: HTS, coated conductors, seed layers, PLD process, YBCO, LPE process, substrate single crystal, fabrication, new
Akin Y., Hascicek Y.S., Aslanoglu Z., Okuyucu H.(okuyucu@gazi.edu.tr), Arda L., Heiba Z.K.(zein_kh@hotmail.com), El-Kawni M.I.(elkawani@magnet.fsu.edu), Tolliver J.C., Barnes P.N.
Koritala R.E., Fisher B.L., Markowitz A.R., Erck R.A., Dorris S.E., Miller D.J., Balachandran U., Meiya L., Beihai M.(bma@anl.gov)
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